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0 (hodnocen0 x )
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EB
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ONLINE
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Weinheim : Wiley-VCH, 2012
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1 online resource (xxxi, 558 p.) : ill. (some col.)
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| Externí odkaz |
 Plný text PDF
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* Návod pro vzdálený přístup
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ISBN 9783527646371 (electronic bk.)
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ISBN 9783527330324
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Includes bibliographical references and index
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pt. 1. Scaling and challenging of Si-based CMOS -- pt. 2. High-k deposition and materials characterization -- pt. 3. Challenge in interface engineering and electrode -- pt. 4. Development in non-Si-based CMOS technology -- pt. 5. High-k Application in novel devices -- pt. 6. Challenge and directions.
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Electronic reproduction. Ann Arbor, MI : ProQuest, 2015. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries
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001744398
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full
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(Au-PeEL)EBL956000
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(CaONFJC)MIL372274
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(CaPaEBR)ebr10653595
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(MiAaPQ)EBC956000
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(OCoLC)798536325
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Dotazy a připomínky