.

0 (hodnocen0 x )

EB

ONLINE

Chichester, West Sussex, U.K. : John Wiley & Sons Inc., 2014

1 online resource (xxiv, 344 p.) : ill

ISBN 9781118703342 (electronic bk.)

ISBN 9781118511886 (hardback)

aESD series

Includes bibliographical references and index

"Electrical Overstress (EOS) continues to impact semiconductor manufacturing, semiconductor components and systems as technologies scale from micro- to nano-electronics. This bookteaches the fundamentals of electrical overstress and how to minimize and mitigate EOS failures. The text provides a clear picture of EOS phenomena, EOS origins, EOS sources, EOS physics, EOS failure mechanisms, and EOS on-chip and system design. It provides an illuminating insight into the sources of EOS in manufacturing, integration of on-chip, and system level EOS protection networks, followed by examples in specific technologies, circuits, and chips.-.

Electronic reproduction. Ann Arbor, MI : ProQuest, 2015. Available via World Wide Web. Access may be limited to ProQuest affiliated libraries

001764096

full

(Au-PeEL)EBL1366277

(CaONFJC)MIL514363

(CaPaEBR)ebr10753372

(MiAaPQ)EBC1366277

(OCoLC)913441214