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0 (hodnocen0 x )

EB

ONLINE

Chichester, West Sussex, United Kingdom ; Hoboken, NJ : Wiley, 2016

1 online resource (299 pages) : illustrations (some color)

ISBN 9781118700204 (electronic bk.)

ISBN 9781118700228

ISBN 9781118700235 (cloth)

Wiley series in quality and reliability engineering

Print version: Gray, Kirk. Next generation HALT and HASS : robust design of electronics and systems. Chichester, West Sussex, United Kingdom : Wiley, 2016 Wiley series in quality and reliability engineering ISBN 9781118700228

Includes bibliographical references and index

Basis and limitations of typical current reliability methods & metrics -- The need for reliability assurance metrics to change -- Challenges to advancing electronics reliability engineering -- A new deterministic reliability development paradigm -- Common understanding of HALT approach is critical for success -- The fundamentals of HALT -- Highly accelerated stress screening (HALT) and audits (HASA) -- HALT benefits for software/firmware performance and reliability -- Quantitative accelerated life test -- Failure analysis and corrective action -- Additional applications of HALT methods.

001847874

full

(Au-PeEL)EBL4451897

(CaONFJC)MIL909295

(CaPaEBR)ebr11172310

(MiAaPQ)EBC4451897

(OCoLC)933211556