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0 (hodnocen0 x )

EB

ONLINE

1st ed.

New York : IOS Press, Incorporated, 2021

1 online resource (480 pages)

ISBN 9781643682471 (electronic bk.)

ISBN 9781643682464

Proceedings of the International School of Physics Enrico Fermi Ser. ; v.206

Print version: Milton, M. J. T. New Frontiers for Metrology: from Biology and Chemistry to Quantum and Data Science New York : IOS Press, Incorporated,c2021 ISBN 9781643682464

Intro -- Title Page -- Contents -- M.J.T. Milton, D.S. Wiersma, C.J. Williams and M. Sega - Preface -- Course group shot -- Andrew J. Lewis - Realising the metre -- Andrew J. Lewis - Dimensional metrology in practice -- E. Massa - Avogadro, Planck and the kilogram redefinition -- Juris Meija - Traceability in chemical measurements: The role of data analysis -- Juris Meija - Atomic weights of the elements: From measurements to the Periodic Table -- S.M. Judge and D.T. Burns - Metrology for the safe and effective use of ionizing radiation. Part 1: Radiation dosimetry -- Carl J. Williams - The SI from platinum to Planck: The biggest revolution in metrology since the French Revolution -- Ekkehard Peik - Optical atomic clocks and tests of fundamental principles -- Paolo Brenni - The production and trade of scientific instruments (1750-1950) -- Martin J.T. Milton and Celine Fellag Ariouet - The metric system, the Metre Convention and the BIPM -- Gael Obein - The measurement of appearance -- S.M. Judge - Metrology for the safe and effective use of ionizing radiation. Part 2: Radioactivity -- A. Henson - Metrological traceability: A global perspective -- Steven Westwood, Gustavo Martos, Norbert Stoppacher and Robert Wielgosz - Metrological applications of NMR and qNMR in organic analysis -- Michela Sega - Reference Materials: Preparation, homogeneity, stability and value assignment -- Patrizia Tavella - Analysing and obtaining statistical information on time varying quantities -- Patrizia Tavella - Timekeeping and navigation systems -- W. Bich - Measurement uncertainty: Historical perspective, present status and foreseeable future -- Carl J. Williams, John H. Lehman and Christopher W. Oates - The future of metrology -- M.-O. Andre - Fundamentals and applications in electrical metrology -- Posters.

Benjamin A. Bircher - Computed tomography for dimensional metrology: Design considerations for high-resolution CT systems -- H. Salouros and M. Collins - Application of stable isotope ratio analysis to profiling methylamphetamine: Challenges to maintain comparability -- M. Marzano - Realization of the farad from the quantum Hall effect with a fully digital bridge: Progress report -- M. Marzano, M. Kruskopf and A.R. Panna - Bridge on a chip: Realization of a Kelvin bridge based on quantum Hall elements for resistance calibration -- B. Fang, H. Le Goff, B. Chupin, L. Lorini, M. Abgrall, P. Blonde, D. Rovera, P. Tuckey, P. Uhrich, J. Achkar, J. Guena, S. Zhang, N. Lucic, R. Le Tagart, Y. Le Coq, S. Bize, H. Alvarez-Martinez, N. Galland, S. Seidelin, A. Ferrier and P. Goldner - From atomic fountains to ultra-stable lasers -- I. Murataj and F. Ferrarese Lupi - Hyperbolic metamaterials by directed self-assembly of block copolymers -- Nompumelelo Leshabane, James Tshilongo, Shadung J. Moja, Napo G. Ntsasa, Gumani Mphaphuli and Mudalo I. Jozela - Improved measurement capabilities for hydrogen sulphide reference gas mixtures in South Africa -- A. Sacco and A.M. Rossi - Metrological aspects of tip-enhanced Raman spectroscopy -- Azure Hansen, Yun-Jhih Chen, John E. Kitching and Elizabeth A. Donley - Point-source atom interferometer gyroscope -- F. Berto and C. Sias - Prospects for single-photon sideband cooling of fermionic lithium -- Douglas G. Bopp, Matthew T. Hummon, Songbai Kang, John Kitching, Qing Li, Daron A. Westly, Sangsik Kim, Kartik Srinivasan and Vladimir Aksyuk - Chip-scale wavelength standards -- List of participants.

001905856

express

(Au-PeEL)EBL29070502

(MiAaPQ)EBC29070502

(OCoLC)1311341048